Congratulations to Prof. Charles H.-P. Wen for being promoted to the Distinguished Professor (2020/8-) by the College of Electrical & Computer Engineering at National Chiao Tung University. See more at http://www.dece.nctu.edu.tw/zh_tw/faculty/prof .
2025 ICCAD accepts two papers from CIA LAB@NYCU
I’m thrilled to proudly show off my brilliant students: They’ve had not one but two papers—both in collaboration with MediaTek—accepted to ICCAD 2025, one of the premier international conferences in the EDA field!
📄 (1) CoP&R: Co-Optimizing Place-and-Route for Standard Cell Layout via MCTS and AllSAT 📄 (2) MuSTNet: SAT-based Exact Multi-Stage Transistor Network Synthesis with Placement Awareness
Huge thanks to their relentless effort, and to the lucky stars that smiled upon them.
ITC’25 Acceptance on “Enhancing Timing Predictability in Automotive Electronics: Addressing Aging and Temperature Distributions”
Congratulations to Jeffery Y.-C. Chen, Aaron C.-W …
IEEE Access Acceptance on “Mitigating Microbursts by Packet Recirculation in Programmable Switch”
Congratulations to Ping-Hsuan on the acceptance of …
Elsevier’s Vehicular Communications acceptance on Michael’s paper
Congratulations to Michael I.-C. Wang for the acce …
ITC’24 Acceptance on “LESER-2: Detailed Consideration in Latch Design under Process Migration for Prevention of Single-Event Double-Node Upsets”
Congratulations to Alan S.-M. Liu, Lowry P.-T. Wan …
Elsevier’s Future Generation Computer Systems acceptance on Alan’s paper
Congratulations to Alan Y.-P. Lee for the acceptan …
MediaTek Advanced Research Center (MARC) Grants Our 3-Year Research Proposal
Congratulations! Our research proposal ‘ChatDTCO: Chat-based Design and Technology Co-Optimization for Generating Design Recipes‘ has just been approved by MediaTek Advanced Research Center (MARC).
ITC’22 Acceptance on “Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65 nm CMOS Technologies”
Congratulations to Ming-Hsien, Pin-Tang and Chia-Wei for the acceptance as the regular paper (Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65 nm CMOS Technologies) by the 2022 IEEE International Test Conference (ITC).
