Congratulations to Alan S.-M. Liu, Lowry P.-T. Wang and Herming Chiueh for the acceptance as the regular paper “LESER-2: Detailed Consideration in Latch Design under Process Migration for Prevention of Single-Event Double-Node Upsets” by the 2024 IEEE International Test Conference (ITC). See https://easychair.org/smart-program/ITC2024/2024-11-07.html#talk:268716