Congratulations to John (Zhung-Li) and Dave (Yu-Wen) for the acceptance of the paper (AMSER-FF: Area-Minimized Soft-Error-Recoverable Flip-Flop for Radiation Hardening) by the 2021 IEEE International Test Conference in Asia (ITC-Asia).
https://sse.tongji.edu.cn/ITC-Asia2021/program.html
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